<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[Sistema Integrado de Bibliotecas do IFPE Search for 'an:5591']]> </title> <!-- prettier-ignore-start --> <link> https://biblioteca.ifpe.edu.br/cgi-bin/koha/opac-search.pl?q=ccl=an%3A5591&#38;sort_by=relevance&#38;format=rss </link> <!-- prettier-ignore-end --> <atom:link rel="self" type="application/rss+xml" href="https://biblioteca.ifpe.edu.br/cgi-bin/koha/opac-search.pl?q=ccl=an%3A5591&#38;sort_by=relevance&#38;format=rss" /> <description> Search results for 'an:5591' at Sistema Integrado de Bibliotecas do IFPE </description> <opensearch:totalResults>2</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>50</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="https://biblioteca.ifpe.edu.br/cgi-bin/koha/opac-search.pl?q=ccl=an%3A5591&#38;sort_by=relevance&#38;format=opensearchdescription" /> <opensearch:Query role="request" searchTerms="q%3Dccl%3Dan%253A5591" startPage="" /> <item> <title> Metrologia e controle dimensional: conceitos, normas e aplicações / </title> <dc:identifier>ISBN:9788535255799</dc:identifier> <!-- prettier-ignore-start --> <link>https://biblioteca.ifpe.edu.br/cgi-bin/koha/opac-detail.pl?biblionumber=6872</link> <!-- prettier-ignore-end --> <description> <img src="https://images-na.ssl-images-amazon.com/images/P/8535255796.01.TZZZZZZZ.jpg" alt="" /> <p> By Silva Neto, João Cirilo da.<br /> Rio de Janeiro: Campus, 2012 .<br /> 239 p. : 9788535255799 </p> <p> <a href="https://biblioteca.ifpe.edu.br/cgi-bin/koha/opac-reserve.pl?biblionumber=6872">Place hold on <em>Metrologia e controle dimensional:</em></a> </p> </description> <guid>https://biblioteca.ifpe.edu.br/cgi-bin/koha/opac-detail.pl?biblionumber=6872</guid> </item> <item> <title> Metrologia e controle dimensional : conceitos, normas e aplicações </title> <dc:identifier>ISBN:9788535255799</dc:identifier> <!-- prettier-ignore-start --> <link>https://biblioteca.ifpe.edu.br/cgi-bin/koha/opac-detail.pl?biblionumber=36245</link> <!-- prettier-ignore-end --> <description> <img src="https://images-na.ssl-images-amazon.com/images/P/8535255796.01.TZZZZZZZ.jpg" alt="" /> <p> By Silva Neto, João Cirilo da.<br /> Rio de Janeiro : Elsevier, 2019 .<br /> xviii, 301p. : , &quot;Revisada e ampliada com questões e exercícios de revisão.&quot; | Acesso a conteúdo complementar em: www.evolution.com.br. | Inclui índice. 24cm..<br /> 9788535255799 </p> <p> <a href="https://biblioteca.ifpe.edu.br/cgi-bin/koha/opac-reserve.pl?biblionumber=36245">Place hold on <em>Metrologia e controle dimensional </em></a> </p> </description> <guid>https://biblioteca.ifpe.edu.br/cgi-bin/koha/opac-detail.pl?biblionumber=36245</guid> </item> </channel> </rss>
